The ScanTRAK II handheld 3D laser scanner sets a new standard for part inspection and reverse engineering applications. Harnessing the power of blue laser technology, the ScanTRAK II provides extremely fast, accurate measurement of complex parts from almost anywhere on the shop floor.
Used in tandem with the PRO CMM optical tracker*, the ScanTRAK II can be used freely within a large measurement volume without mechanical tethers. With Dynamic Part Referencing, environmental vibration is automatically compensated for during data collection. This functionality makes the ScanTRAK II a versatile and robust solution for conducting in-situ inspections in the most challenging shop-floor conditions.
The ScanTRAK II features a wide beam strip for maximum part coverage in less time, while its balanced ergonomic grip provides comfortable, extended scanning sessions with less operator fatigue. Diverse multi-surface scanning without part treatment further increases operator productivity – by almost 300%.
|Dimensions (LxWxH)||200 mm x 140 mm x 260 mm|
|System Accuracy1||Up to 25 µm||Up to 25 µm|
|*Localizer Volume||Up to 35 m3||Up to 35 m3|
|Field of View Mode
|Field of View Mode
|Measurement Accuracy2||7 μm||7 μm|
|Minimum Point Spacing||35 µm||38 µm|
|Max. Field Width||120 mm||51 mm|
|Mid. Field Width||95 mm||45 mm|
|Min. Field Width||70 mm||38 mm|
|Stripe Width||120 mm||51 mm|
|Measuring Range||100 mm||50 mm|
|Stand-Off||80 mm||93 mm|
|Max. Frame Rate||150 Hz||450 Hz|
|Points Per Stripe||2,000||1,000|
|Scanning Speed (points per second)||300,000||450,000|
|Laser Power Adjustment||ESP4 real-time per point|
|Certifications||CE, IEC 60825-1|
|Environmental||10°C to 40°C|
|Compatible Software||Polyworks®, Geomagic®, Metrologic®, Focus|
1Diameter of a sphere measured in Zone 1 (RMS in environmentally stable conditions).
2Typical values are 30% better than published values. Laser Scanning Accuracy is determined by scanning a plate from various directions, each time using the entire scanner field of view. The result is the maximum 1σ deviation of the scan data to fitted plane features.